| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Vocabulary and character for geometrical optics
|
Published |
|
На языке оригинала
|
3168,00
|
|
|
|
Accuracy of optical transfer functionпј€OTFпј‰measurement
|
Published |
|
На языке оригинала
|
2246,00
|
|
|
|
Method for testing refractive index of crystals
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
|
Method for testing cryogenic transmissivityof crystals
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
|
Transparent conductive thin film speciation for optical instruments
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
|
Specication for multispectral antireflection coatings
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
|
Indoor method for testing measurement range of pulse laser rangfinders
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
|
Nanotechnologies―Characterization of single-wall carbon nanotubes using transmission electron microscopy
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Spectral calibration in laboratory for dispersive hyperspectral sensor
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
|
Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Test method for refractive index of infrared optical chalcogenide films
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
|
General specification of lunar and planetary in-situ exploration camera
|
Published |
|
На языке оригинала
|
1786,00
|
|
| Страницы: 1 |