|
|
Letter symbols for semiconductor integrated circuits--Letter symbols for function of pins
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Series and products of voltage regulators for semi-conductor integrated circuits
|
Published |
|
На языке оригинала
|
7142,00
|
|
|
|
Semiconductor integrated circuits—Measuring method of voltage regulators
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Blank detail specification for semiconductor inte-grated circuit static read/write memories
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Outline dimensions of semiconductor integrated circuits
|
Published |
|
На языке оригинала
|
13363,00
|
|
|
|
Generic specification for film integrated circuits and hybrid film integrated circuits
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Terminology for integrated circuits
|
Published |
|
На языке оригинала
|
8410,00
|
|
|
|
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Five:Blank detail specification for complementary MOS digital inte-grated circuitsпјЊseries 4000B and 4000UB
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Semiconductor devices—Integrated circuits—Part 21：Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Terminology for film integrated circuits and hybrid film integrated circuits
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Semiconductor devices—Integrated circuits—Part 21-1：Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Limits and methods of measurement of radio interference characteristics of electric power plant with internal combustion engines--Conducted interference
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Semiconductor integrated circuits—Measuring method of analogue switch
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
General principles of measuring methods of timer circuits for semiconductor integrated circuits
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
|
Published |
|
На языке оригинала
|
1670,00
|
|
| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 ... / 8 |