Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Letter symbols for semiconductor integrated circuits--Letter symbols for function of pins
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Published |
На языке оригинала
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1210,00
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Series and products of voltage regulators for semi-conductor integrated circuits
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Published |
На языке оригинала
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1613,00
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Semiconductor integrated circuits—Measuring method of voltage regulators
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Published |
На языке оригинала
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2074,00
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Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
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Published |
На языке оригинала
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1382,00
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Blank detail specification for semiconductor inte-grated circuit static read/write memories
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Published |
На языке оригинала
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1382,00
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Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
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Published |
На языке оригинала
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2246,00
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Outline dimensions of semiconductor integrated circuits
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Published |
На языке оригинала
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12442,00
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Generic specification for film integrated circuits and hybrid film integrated circuits
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Published |
На языке оригинала
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2074,00
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Terminology for integrated circuits
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Published |
На языке оригинала
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2707,00
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Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Five:Blank detail specification for complementary MOS digital inte-grated circuitsпјЊseries 4000B and 4000UB
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Published |
На языке оригинала
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1210,00
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Semiconductor devices—Integrated circuits—Part 21:Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
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Published |
На языке оригинала
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1613,00
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Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
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Published |
На языке оригинала
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2074,00
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Terminology for film integrated circuits and hybrid film integrated circuits
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Published |
На языке оригинала
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1843,00
|
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Semiconductor devices—Integrated circuits—Part 21-1:Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
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Published |
На языке оригинала
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1382,00
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Limits and methods of measurement of radio interference characteristics of electric power plant with internal combustion engines--Conducted interference
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Published |
На языке оригинала
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1094,00
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Semiconductor integrated circuits—Measuring method of analogue switch
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Published |
На языке оригинала
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2074,00
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General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
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Published |
На языке оригинала
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1613,00
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General principles of measuring methods of timer circuits for semiconductor integrated circuits
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Published |
На языке оригинала
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1382,00
|
|
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General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
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Published |
На языке оригинала
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1613,00
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|
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General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
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Published |
На языке оригинала
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1210,00
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