| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Testing method for crystallographic perfection of silicon by preferential etch techniques
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Published |
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На языке оригинала
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2477,00
|
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Test method for detection of oxidation induced defects in polished silicon wafers
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Published |
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На языке оригинала
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2189,00
|
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Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
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Published |
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На языке оригинала
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1382,00
|
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Monocrystalline germanium and monocrystalline germanium slices
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Published |
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На языке оригинала
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1670,00
|
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Test method for measuring resistivity of silicon wafer using spreading resistance probe
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Published |
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На языке оригинала
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1670,00
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Test method for thickness and total thickness variation of silicon slices
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Published |
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На языке оригинала
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1670,00
|
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Test methods for bow of silicon wafers
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Published |
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На языке оригинала
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1670,00
|
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Test method for measuring warp on silicon slices by noncontact scanning
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Published |
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На языке оригинала
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1670,00
|
|
|
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Testing methods for surface flatness of silicon slices
|
Published |
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На языке оригинала
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1382,00
|
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Standard method for measuring the surface quality of polished silicon slices by visual inspection
|
Published |
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На языке оригинала
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1382,00
|
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Collection of metallographs on defects of germanium crystal
|
Published |
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На языке оригинала
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5184,00
|
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Indium antimonide polycrystal,single crystals and as-cut slices
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Published |
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На языке оригинала
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1670,00
|
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Liquid encapsulated czochralski - grown gallium arsenide single crystals and as-cut slicesгЂЂгЂЂ
|
Published |
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На языке оригинала
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1786,00
|
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Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
|
Published |
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На языке оригинала
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1786,00
|
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Monocrystalline silicon
|
Published |
|
На языке оригинала
|
1670,00
|
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Electronic-grade polycrystalline silicon
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Published |
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На языке оригинала
|
1670,00
|
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Monocrystalline silicon polished wafers
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
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Monocrystalline silicon as cut wafers and lapped wafers
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
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Test method for measuring flat length wafers of silicon and other electronic materials
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
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Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
|
Published |
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На языке оригинала
|
1670,00
|
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