| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
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Published |
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На языке оригинала
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1382,00
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Testing method for crystallographic perfection of silicon by preferential etch techniques
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Published |
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На языке оригинала
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1843,00
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Testing methods for determining the orientation of a semiconductor single crystal
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Published |
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На языке оригинала
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1210,00
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Test method for substitutional atomic carbon concent of silicon by infrared absorption
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Published |
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На языке оригинала
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1210,00
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Silicon metal
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Published |
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На языке оригинала
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1210,00
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Test method for detection of oxidation induced defects in polished silicon wafers
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Published |
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На языке оригинала
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1613,00
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Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
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Published |
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На языке оригинала
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1094,00
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Monocrystalline germanium and monocrystalline germanium slices
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Published |
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На языке оригинала
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1210,00
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Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
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Published |
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На языке оригинала
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1210,00
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Test method for measuring resistivity of silicon wafer using spreading resistance probe
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Published |
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На языке оригинала
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1210,00
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Test method for thickness and total thickness variation of silicon slices
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Published |
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На языке оригинала
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1210,00
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Test methods for bow of silicon wafers
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Published |
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На языке оригинала
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1210,00
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Test method for measuring warp on silicon slices by noncontact scanning
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Published |
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На языке оригинала
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1210,00
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Testing methods for surface flatness of silicon slices
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Published |
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На языке оригинала
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1094,00
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Standard method for measuring the surface quality of polished silicon slices by visual inspection
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Published |
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На языке оригинала
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1094,00
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Collection of metallographs on defects of germanium crystal
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Published |
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На языке оригинала
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4493,00
|
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Indium antimonide polycrystal,single crystals and as-cut slices
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Published |
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На языке оригинала
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1210,00
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Liquid encapsulated czochralski - grown gallium arsenide single crystals and as-cut slicesгЂЂгЂЂ
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Published |
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На языке оригинала
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1382,00
|
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Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
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Published |
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На языке оригинала
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1382,00
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Monocrystalline silicon
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Published |
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На языке оригинала
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1210,00
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| Страницы: 1 / 2 / 3 / 4 / 5 / 6 |