| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Technical guidelines for river ecological security assessment
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Technical guidelines for evaluation of the aquatic ecological health
|
Published |
|
На языке оригинала
|
4378,00
|
|
|
|
Guidelines for evaluation of water saving industrial parks
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Tractor—Automatic assistant steering systems—General technical specification
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Metal spinning formability and test methods—Formability, formability indexes and general test code of practice
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Non-destructive testing—Guided wave testing of ultrasonic phased array cylindrical imaging
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Additive manufacturing—Requirements for data quality of three-dimensional process model
|
Published |
|
На языке оригинала
|
1670,00
|
|
|
|
Heavy mechanical—Design specification for weldments
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Additive manufacturing—Supperalloy powder used for laser powder bed fusion
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Full locked cable for building structures
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Test method for protective agents for heating system
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Test methods for foamed concrete and its products
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Rectorite
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Sintered neodymium iron boron permanent magnets—Steady state damp heat tests
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Radio frequency identification (RFID) tyre tags
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
|
Steel wire ropes—Creep testing method
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
|
Thermal preinsulated ductile iron pipes, fittings and accessories
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
|
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 1: Classification of defects
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 2: Test method for defects using optical inspection
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 3: Test method for defects using photoluminescence
|
Published |
|
На языке оригинала
|
2477,00
|
|
| Страницы: ... / 2188 / 2189 / 2190 / 2191 / 2192 / 2193 / 2194 / 2195 / 2196 / 2197 / 2198 / 2199 / 2200 / 2201 ... / 2298 |