| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Microbeam analysis—General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)
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Published |
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На языке оригинала
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1670,00
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General guide of transmission electron microscope (TEM)- X-ray energy dispersive spectrometry(EDS) quantitative microanalysis for thin biological specimens
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Published |
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На языке оригинала
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1670,00
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Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
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Published |
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На языке оригинала
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3110,00
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Microbeam analysis - General guide for electron backscatter diffraction analysis
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Published |
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На языке оригинала
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1786,00
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Surface chemical analysis—General rules for glow discharge optical emission spectrometry (GD-OES)
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Published |
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На языке оригинала
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1786,00
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Electrochemical oxygenmeter for medical hyperbaric oxygen chamber
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Published |
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На языке оригинала
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1670,00
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Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials
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Published |
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На языке оригинала
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2189,00
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Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
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Published |
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На языке оригинала
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2189,00
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Expression of performance of electrochemical analyzers Part1: General
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Published |
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На языке оригинала
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2477,00
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Expression of performance of electrochemical analyzers - Part 2: pH value
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Published |
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На языке оригинала
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1786,00
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Expression of performance of electrochemical analyzers - Part 3: Electrolytic conductivity
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Published |
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На языке оригинала
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2189,00
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Expression of performance of electrochemical analyzers - Part 4: Dissolved oxygen in water measured by membrane covered amperometric sensors
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Published |
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На языке оригинала
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2477,00
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Expression of performance of electrochemical analyzers - Part 5: Oxidation-reduction potential or redox potential
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Published |
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На языке оригинала
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1786,00
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Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
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Published |
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На языке оригинала
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2477,00
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Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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Published |
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На языке оригинала
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1670,00
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Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
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Published |
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На языке оригинала
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1786,00
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Industrial circulating cooling water - Determination of carbonate alkalinity
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Published |
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На языке оригинала
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1382,00
|
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Surface chemical analysis - Information formats
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Published |
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На языке оригинала
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2189,00
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Fourier transform infrared spectrometer
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Published |
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На языке оригинала
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1670,00
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Atomic absorption spectrophotometer
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Published |
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На языке оригинала
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1786,00
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