| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Surface chemical analysis - High resolution auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
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Published |
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На языке оригинала
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2822,00
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Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
|
Published |
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На языке оригинала
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1786,00
|
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Determination of hexabromocyclododecane in electrical and electronic products - Gas chromatography-mass spectrometry
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Published |
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На языке оригинала
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1382,00
|
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Industrial-process contro l- Safety of analyser houses
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Published |
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На языке оригинала
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2477,00
|
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Analyser systems - Guide to technical enquiry and bid evaluation
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Published |
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На языке оригинала
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2822,00
|
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On-line analyser systems - Guide to design and installation
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Published |
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На языке оригинала
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5587,00
|
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Determination of Benzene, toluene and xylene in crude benzene
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Published |
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На языке оригинала
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1670,00
|
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Thermal analyzer for molten cast iron
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Published |
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На языке оригинала
|
1786,00
|
|
|
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General specifications for laboratory centrifuge
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
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Preparation method of calibration solution for atomic absorption measurement
|
Published |
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На языке оригинала
|
1670,00
|
|
|
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Normalization construction and basic requirements of instruments and equipments of conservation and restoration laboratory of Movable Cultural Relics
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Published |
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На языке оригинала
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1786,00
|
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|
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Oscillographic polarograph and its test solution
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Published |
|
На языке оригинала
|
1786,00
|
|
|
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General rule for test methods of highly purified reagents
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
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Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
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Surface chemical analysis―Auger electron spectroscopy and X-ray photoelectron spectroscopy―Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Published |
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На языке оригинала
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2822,00
|
|
|
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Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
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Published |
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На языке оригинала
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4032,00
|
|
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Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
|
Published |
|
На языке оригинала
|
2822,00
|
|
|
|
Microbeam analysis―Electron probe microanalysis―Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
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Surface chemical analysis―Guidelines for preparation and mounting of specimens for analysis
|
Published |
|
На языке оригинала
|
2477,00
|
|
|
|
General specification for intelligent oxygen bomb calorimeter
|
Published |
|
На языке оригинала
|
1670,00
|
|
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