| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
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Published |
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На языке оригинала
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1786,00
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Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
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Published |
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На языке оригинала
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2822,00
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Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
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Published |
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На языке оригинала
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2477,00
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Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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Published |
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На языке оригинала
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2189,00
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Measuring method for surface areas of materials—Three dimensional area measurement base on hyperspectral imaging
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Published |
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На языке оригинала
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1786,00
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Determination of 5 kinds of ammonium chloride antibacterial agents in toothpaste—High performance liquid chromatography method
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Published |
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На языке оригинала
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1670,00
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Determination of metronidazole and norfloxacin in toothpaste—High performance liquid chromatography method
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Published |
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На языке оригинала
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1382,00
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Determination of forbidden bleach in toothpaste—High performance liquid chromatography method
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Published |
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На языке оригинала
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1382,00
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Determination of restricted preservatives in toothpaste—High performance liquid chromatography method
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Published |
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На языке оригинала
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1382,00
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Method for analysing CCA and ACQ in preservative-treated wood and wood preservatives by X-ray fluorescence spectroscopy
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Published |
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На языке оригинала
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1382,00
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General specification for Raman spectrometers
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Published |
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На языке оригинала
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1786,00
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Chemicals—Liquid or solid identification—Fluidity test method
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Published |
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На языке оригинала
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1382,00
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Microbeam analysis—Analytical electron microscopy—Vocabulary
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Published |
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На языке оригинала
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3398,00
|
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Nanotechnologies—Characterization of multiwall carbon nanotubes—Mesoscopic shape factors
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Published |
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На языке оригинала
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2189,00
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Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
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Published |
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На языке оригинала
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2074,00
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Nanotechnologies—Determination of sulfur, fluorine, chlorine and bromine content in graphene flakes—Combustion ion chromatography method
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Published |
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На языке оригинала
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1786,00
|
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Nanotechnologies—Determination of water-soluble anions content in graphene powder—Ion chromatography method
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Published |
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На языке оригинала
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1786,00
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Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
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Published |
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На языке оригинала
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2477,00
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Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
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Published |
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На языке оригинала
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2477,00
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Microbeam analysis—Method of specimen preparation for analysis of general powders using WDS and EDS
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Published |
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На языке оригинала
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1786,00
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