| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals
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Published |
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На языке оригинала
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2880,00
|
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Analysis of water treatment chemicals—Part 1: Determination of phosphorus
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Published |
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На языке оригинала
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1670,00
|
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Analysis of water treatment chemicals—Part 2: Determination of arsenic, mercury, cadmium, chromium, lead, nickel and copper—Inductively coupled plasma mass spectrometry(ICP-MS)
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Published |
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На языке оригинала
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1786,00
|
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Nanotechnology—Measurement of defect concentration of graphene—Raman spectroscopy method
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Published |
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На языке оригинала
|
3110,00
|
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Nanotechnology—Measurement for oxygen content and C/O of graphene powder—X-ray photoelectron spectroscopy
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Published |
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На языке оригинала
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2074,00
|
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Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
|
Published |
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На языке оригинала
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2822,00
|
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Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
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Published |
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На языке оригинала
|
2822,00
|
|
|
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Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
|
Published |
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На языке оригинала
|
2189,00
|
|
|
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Determination of dispersing performance for water treatment chemicals—Part 1：Dispersing kaolin method
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Published |
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На языке оригинала
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1382,00
|
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Nanotechnology—Measurement methods for carrier mobility and sheet resistance of graphene films of sub-nanometer thickness
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Published |
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На языке оригинала
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2477,00
|
|
|
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Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
|
Published |
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На языке оригинала
|
2189,00
|
|
|
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Test method for performance of water activity meters
|
Published |
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На языке оригинала
|
1786,00
|
|
|
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General rules for microwave plasma atomic emission spectrometry
|
Published |
|
На языке оригинала
|
2189,00
|
|
|
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General rules for direct sampling mercury analysis method
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Published |
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На языке оригинала
|
2189,00
|
|
|
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Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal
|
Published |
|
На языке оригинала
|
3110,00
|
|
|
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Microbeam analysis—Electron probe microanalyser (EPMA)—Guidelines for performing quality assurance procedures
|
Published |
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На языке оригинала
|
3110,00
|
|
|
|
General rules for high performance liquid chromatography-quadrupole inductively coupled plasma-mass spectrometry
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
|
Published |
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На языке оригинала
|
1786,00
|
|
|
|
General rules for chemical vapor generation-atomic fluorescence spectrometry
|
Published |
|
На языке оригинала
|
1786,00
|
|
|
|
Nanotechnologies—Measurement of the hydrogen storage capacity of nanoporous materials—Gas adsorption method
|
Published |
|
На языке оригинала
|
2189,00
|
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