| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
|
|
Microwave circuits—Measuring methods for frequency source
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
Test methods for endurance and data retention of non-volatile memory
|
Published |
|
На языке оригинала
|
1058,00
|
|
|
|
Logic digital integrated circuits—Specification for I/O interface model for integrated circuit
|
Published |
|
На языке оригинала
|
3578,00
|
|
|
|
Test methods for flip chip integrated circuits
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
Semiconductor integrated circuits—Measuring method of level converter
|
Published |
|
На языке оригинала
|
1966,00
|
|
|
|
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
|
Published |
|
На языке оригинала
|
2369,00
|
|
|
|
Specification for serial NOR flash interface
|
Published |
|
На языке оригинала
|
2167,00
|
|
|
|
Specification for serial NAND flash interface
|
Published |
|
На языке оригинала
|
1966,00
|
|
|
|
Semiconductor die products—Part 1：Requirements for procurement and use
|
Published |
|
На языке оригинала
|
2369,00
|
|
|
|
Semiconductor die products—Part 2: Exchange data formats
|
Published |
|
На языке оригинала
|
3780,00
|
|
|
|
Semiconductor die products—Part 3: Guide for handling, packing and storage
|
Published |
|
На языке оригинала
|
1966,00
|
|
|
|
Semiconductor die products—Part 4: Requirements for die users and suppliers
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
Semiconductor die products—Part 5：Requirements for concerning electrical simulation
|
Published |
|
На языке оригинала
|
1058,00
|
|
|
|
Semiconductor die products—Part 6: Requirements for concerning thermal simulation
|
Published |
|
На языке оригинала
|
958,00
|
|
|
|
Semiconductor die products—Part 7: XML schema for data exchange
|
Published |
|
На языке оригинала
|
2167,00
|
|
|
|
Semiconductor die products—Part8: EXPRESS model schema for data exchange
|
Published |
|
На языке оригинала
|
1814,00
|
|
|
|
Microwave circuits—Measuring methods for voltage controlled oscillater
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
General specification for MEMS electric field sensor
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
|
Published |
|
На языке оригинала
|
1411,00
|
|
|
|
Semiconductor integrated circuit—Measuring methods for flash memory
|
Published |
|
На языке оригинала
|
1411,00
|
|
| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 |