| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Micro-electromechanical system technology—The reliability test methods of MEMS in integrated environments
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Published |
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На языке оригинала
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2477,00
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Micro-electromechanical system technology—Test methods for tensile property measurement of strip thin films
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Published |
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На языке оригинала
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1786,00
|
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Micro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration
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Published |
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На языке оригинала
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2189,00
|
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Itegrated circuit (IC)card packaging framework
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Published |
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На языке оригинала
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2477,00
|
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Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches
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Published |
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На языке оригинала
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3398,00
|
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Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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Published |
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На языке оригинала
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3168,00
|
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Semiconductor devices—Micro-electromechanical devices—Part 19: Electronic compasses
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Published |
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На языке оригинала
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2880,00
|
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Microwave circuit—Measuring methods for electrically controlled attenuator
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Published |
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На языке оригинала
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2477,00
|
|
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Semiconductor integrated circuits—System on chip(SoC)
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Published |
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На языке оригинала
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1786,00
|
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Microwave semiconductor integrated circuits—Frequency mixer
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Published |
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На языке оригинала
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3110,00
|
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Microwave semiconductor integrated circuits—Amplifier
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Published |
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На языке оригинала
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1786,00
|
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Semiconductor integrated circuits—Measuring method of Holzer circuit
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Published |
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На языке оригинала
|
1786,00
|
|
|
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Semiconductor integrated circuits—Analog digital（AD） converter
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Published |
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На языке оригинала
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3110,00
|
|
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Semiconductor intergrated circuits—Test method of direct digital frequency synthesizer
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Published |
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На языке оригинала
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3398,00
|
|
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Micro-electromechanical systems（MEMS）technology—Bending strength test method for microstructures of silicon based MEMS
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Published |
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На языке оригинала
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1786,00
|
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Micro-electromechanical systems（MEMS） technology—Impact test method for nanostructures of silicon based MEMS
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Published |
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На языке оригинала
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1786,00
|
|
|
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Micro-electromechanical systems（MEMS） technology—Tensile strength test method for nano-scale membranes of silicon based MEMS
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Published |
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На языке оригинала
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1786,00
|
|
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
|
Published |
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На языке оригинала
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2477,00
|
|
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
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Published |
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На языке оригинала
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2822,00
|
|
|
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Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
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Published |
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На языке оригинала
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2362,00
|
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| Страницы: 1 / 2 / 3 / 4 / 5 / 6 / 7 / 8 |