Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Quality and technical requirements for metal packages used for integrated circuits
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Published |
На языке оригинала
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3398,00
|
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General specification for microwave integrated circuit chip for aerospace
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Published |
На языке оригинала
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2822,00
|
|
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4 Mb/s digital time division command/response multiplex data bus test plan
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Published |
На языке оригинала
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5933,00
|
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Microwave circuits—Measuring methods for limiter
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Published |
На языке оригинала
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2477,00
|
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Integrated circuit 3D packaging— Requirement for die stack process and evaluation
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Published |
На языке оригинала
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2822,00
|
|
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Guideline for intellectual property(IP) core protection
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Published |
На языке оригинала
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2189,00
|
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Integrated circuit 3D packaging—Requirement for bumping-wafer-thining process and evaluation
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Published |
На языке оригинала
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1786,00
|
|
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General requirements for integral substrate of System in Packageпј€SiPпј‰
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Published |
На языке оригинала
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2822,00
|
|
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Integrated circuit 3D packaging—Requirement for bumping-wafer-sawing process and evaluation
|
Published |
На языке оригинала
|
1786,00
|
|
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Design assurance guidelines for complex integrated circuits
|
Published |
На языке оригинала
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2477,00
|
|
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Terminology of system in packgaeпј€SiPпј‰
|
Published |
На языке оригинала
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2477,00
|
|
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Integrated circuits—EMC evaluation of transceivers—Part 1:General conditions and definitions
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Published |
На языке оригинала
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1670,00
|
|
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EMC IC modelling—Part 1:General modelling framework
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Published |
На языке оригинала
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5587,00
|
|
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Integrated circuit TSV 3D package reliability test methods guideline
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Published |
На языке оригинала
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1670,00
|
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