| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
в рублях |
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Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction
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Published |
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На языке оригинала
|
1210,00
|
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|
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Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
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Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
|
Published |
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На языке оригинала
|
1382,00
|
|
|
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Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
|
Published |
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На языке оригинала
|
1210,00
|
|
|
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Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
|
Published |
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На языке оригинала
|
1094,00
|
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|
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Solar-grade polycrystalline silicon
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Published |
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На языке оригинала
|
1210,00
|
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Gallium arsenide single crystal for solar cell
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Published |
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На языке оригинала
|
1210,00
|
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Monocrystalline silicon for solar cell
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Published |
|
На языке оригинала
|
1210,00
|
|
|
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Specification for polished test silicon wafers
|
Published |
|
На языке оригинала
|
1613,00
|
|
|
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practice for shallow etch pit detection on silicon
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
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Standard test method for dimensions of notches on silicon wafers
|
Published |
|
На языке оригинала
|
1210,00
|
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|
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Annealed monocrystalline silicon wafers
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Published |
|
На языке оригинала
|
1267,00
|
|
|
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Monocrystalline silicon wafers for solar cells
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
|
Germanium single crystal for solar cell
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
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Casting multicrystalline silicon brick for photovoltaic solar cell
|
Published |
|
На языке оригинала
|
1382,00
|
|
|
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Multicrystalline silicon wafers for photovoltaic solar cell
|
Published |
|
На языке оригинала
|
1210,00
|
|
|
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Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
|
Published |
|
На языке оригинала
|
1613,00
|
|
|
|
300mm monocrystalline silicon
|
Published |
|
На языке оригинала
|
1094,00
|
|
|
|
Test method for measuring surface roughness on planar surfaces of silicon wafer
|
Published |
|
На языке оригинала
|
2246,00
|
|
|
|
300mm polished monocrystalline silicon wafers
|
Published |
|
На языке оригинала
|
1210,00
|
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