Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Surface acoustic wave(SAW) resonators - Part 3:Standard outlines and lead connections
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Guide to the measurement of equivalent electrical parameters of quartz crystal units
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Quartz crystal units - A specification in the IEC quality assessment system for electronic components(IECQ) - Part 2:Sectional specification - Capability approval - Section 1:Blank detail specification
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification – Capability approval
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Quartz crystal units - A specification in the IEC quality assessment system for electronic components(IECQ) - Part 3:Sectional specification - Qualification approval - Section 1:Blank detail specification
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Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) -Part 3: Sectional specification - Qualification approval
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Piezoelectric devices - Preparation of outline drawings of surfacemounted devices(SMD) for frequency control and selection - General rules
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Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
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Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components(IECQ) - Part 2:Sectional specification - Qualification approval - Section 1:Blank detail specification - Assessment level E
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Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification-Qualification approval
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Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification – Qualification approval
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Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components(IECQ) - Part 2:Sectional specification - Qualification approval - Section 1:Blank detail specification - Assessment level E
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Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
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Filters using waveguide type dielectric resonators - Part 1: Generic specification
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Filters using waveguide type dielectric resonators - Part 2:Guidance for use
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Waveguide type dielectric resonators в”Ђ Part 1-4: General information and test conditions в”Ђ Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
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Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
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Waveguide type dielectric resonators в”Ђ Part 1: Generic specification
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Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
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Waveguide type dielectric resonators - Part 4-1: Blank detail specification
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