Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Semiconductor devices -- Part 17: Magnetic and capacitive coupler for basic and reinforced insulation ((IEC 60747-17:2020) EN IEC 60747-17:2020) (english version)
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На английском языке
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Semiconductor devices -- Part 17: Magnetic and capacitive coupler for basic and reinforced insulation ((IEC 60747-17:2020) EN IEC 60747-17:2020) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency ((IEC 60749-12:2017) EN IEC 60749-12:2018) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency ((IEC 60749-12:2017) EN IEC 60749-12:2018) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere ((EC 60749-13:2018) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere (( IEC 60749-13:2018) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation (IEC 60749-17:2019) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation (IEC 60749-17:2019) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (( IEC 60749-26:2018) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (( IEC 60749-26:2018) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 1: General requirements of power interface for automotive vehicle sensors (IEC 62969-1:2017) (english version)
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На английском языке
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0,00
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 1: General requirements of power interface for automotive vehicle sensors (IEC 62969-1:2017) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (IEC 62969-2:2018) (english version)
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На английском языке
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0,00
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 62969-3:2018) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 62969-3:2018) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 4: Evaluation method of data interface for automotive vehicle sensors ((IEC 62969-4:2018) EN IEC 62969-4:2018) (german version)
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На немецком языке
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Semiconductor devices - Semiconductor interface for automotive vehicles -- Part 4: Evaluation method of data interface for automotive vehicle sensors ((IEC 62969-4:2018) EN IEC 62969-4:2018) (english version)
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На английском языке
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