| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
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Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
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На языке оригинала
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Пишите на gost@gostinfo.ru
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Vocabulary
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Microbeam analysis - EMSA/MAS standard file format for spectral-data exchange
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Information format for static secondary-ion mass spectrometry
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry(EDS)
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Surface chemical analysis - Depth profiling - Measurement of sputtered depth
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Methods for determination of lead in ores
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На языке оригинала
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Пишите на gost@gostinfo.ru
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Methods for determination of tungsten in ores
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На языке оригинала
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Пишите на gost@gostinfo.ru
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