Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%) в рублях |
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Mechanical standardization of semiconductor devices -- Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA) (IEC 60191-6-13:2016) (german version)
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Mechanical standardization of semiconductor devices -- Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA) (IEC 60191-6-13:2016) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 3: External visual examination (IEC 60749-3:2017) (german version)
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Semiconductor devices - Mechanical and climatic test methods -- Part 3: External visual examination (IEC 60749-3:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature (IEC 60749-6:2017) (german version)
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Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature (IEC 60749-6:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 9: Permanence of marking (IEC 60749-9:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 9: Permanence of marking (IEC 60749-9:2017) (german version)
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Semiconductor devices - Mechanical and climatic test methods -- Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017) (english version)
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На английском языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices ( IEC 60749-44:2016) (german version)
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На немецком языке
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Semiconductor devices - Mechanical and climatic test methods -- Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices ( IEC 60749-44:2016) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 1: General requirements ( IEC 62779-1:2016) (english version)
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На английском языке
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Semiconductor devices - Semiconductor interface for human body communication -- Part 1: General requirements ( IEC 62779-1:2016) (german version)
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