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Essential ratings and characteristics for semiconductor pressure sensor elements
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Principal measuring methods for semiconductor pressure sensor elements
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Test methods of hot-film flow sensors
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Test methods of semiconductor acceleration sensors
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Pyroelectric infrared sensor
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Semiconductor converters - Part 2:Self-commutated converters including direct d.c. converters
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Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
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Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
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LED modules for general lighting - Safety specifications
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Semiconductor devices - MEMS devices - Part 5: RF MEMS switches
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SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
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Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
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Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
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DC or AC supplied electronic control gear for LED modules - Performance requirements
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Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
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